Invention Application
- Patent Title: SOLDER JOINT RELIABILITY IN MICROELECTRONIC PACKAGING
- Patent Title (中): 微电子封装中的焊接点可靠性
-
Application No.: US12610211Application Date: 2009-10-30
-
Publication No.: US20100044848A1Publication Date: 2010-02-25
- Inventor: Daewoong Suh , Stephen E. Lehman, JR. , Mukul Renavikar
- Applicant: Daewoong Suh , Stephen E. Lehman, JR. , Mukul Renavikar
- Main IPC: H01L23/485
- IPC: H01L23/485

Abstract:
A microelectronic assembly and method for fabricating the same are described. In an example, a microelectronic assembly includes a microelectronic device having a surface with one or more areas to receive one or more solder balls, the one or more areas having a surface finish comprising Ni. A solder material comprising Cu, such as flux or paste, is applied to the Ni surface finish and one or more solder balls are coupled to the microelectronic device by a reflow process that forms a solder joint between the one or more solder balls, the solder material comprising Cu, and the one or more areas having a surface finish comprising Ni.
Public/Granted literature
- US08018063B2 Solder joint reliability in microelectronic packaging Public/Granted day:2011-09-13
Information query
IPC分类: