Invention Application
- Patent Title: Signal Coupling System For Scanning Microwave Microscope
- Patent Title (中): 扫描微波显微镜信号耦合系统
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Application No.: US12208432Application Date: 2008-09-11
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Publication No.: US20100058846A1Publication Date: 2010-03-11
- Inventor: Hassan Tanbakuchi , Matthew Richter , Michael Whitener
- Applicant: Hassan Tanbakuchi , Matthew Richter , Michael Whitener
- Main IPC: G12B21/00
- IPC: G12B21/00

Abstract:
A signal coupling system interposed between a scanning probe and a measurement instrument provides signal communication between the scanning probe and the measurement instrument. The signal coupling system has a pre-stressed shape when the scanning probe is in a neutral position. The pre-stressed shape is designated to provide a characteristic impedance of the signal coupling system that varies linearly as a function of displacement of the scanning probe from the neutral position when the scanning probe is displaced, relative to the neutral position, over a designated range of displacements.
Public/Granted literature
- US07793356B2 Signal coupling system for scanning microwave microscope Public/Granted day:2010-09-07
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