发明申请
- 专利标题: ULTRASONIC INSPECTION APPARATUS
- 专利标题(中): 超声波检查装置
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申请号: US12517234申请日: 2008-01-24
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公开(公告)号: US20100058871A1公开(公告)日: 2010-03-11
- 发明人: Masayuki Takeishi , Masanori Shimazaki , Masahiro Yui , Tomoyuki Hirayama
- 申请人: Masayuki Takeishi , Masanori Shimazaki , Masahiro Yui , Tomoyuki Hirayama
- 申请人地址: JP Tokyo
- 专利权人: MITSUBISHI HEAVY INDUSTRIES, LTD.
- 当前专利权人: MITSUBISHI HEAVY INDUSTRIES, LTD.
- 当前专利权人地址: JP Tokyo
- 优先权: JP2007-092515 20070330
- 国际申请: PCT/JP2008/050973 WO 20080124
- 主分类号: G01N29/00
- IPC分类号: G01N29/00
摘要:
An ultrasonic inspection apparatus is provided in which the size of the apparatus can be made compact by using laser light, the degradation and deformation of the inspected object is prevented, and a broad range of inspections can be carried out. An ultrasonic inspection apparatus (1) is provided with a laser apparatus (5) that irradiates laser light and a volumetric inspection ultrasonic wave transmitter (17) having a transmitting diaphragm (39) that is irradiated by the laser light emitted by the laser apparatus (5) and that generates ultrasonic waves (C); and the ultrasonic inspection apparatus (1) carries out volumetric inspections by irradiating the ultrasonic waves (C) that are generated by the transmitting diaphragm (39) of the ultrasonic wave transmitting portion (17) to the inspected object. In addition, the ultrasonic inspection apparatus (1) is further provided with a surface inspection ultrasonic wave transmitting portion (19), and enables the carrying out of inspections having the characteristics of volumetric inspections and surface inspections, that is, hybrid inspections.
公开/授权文献
- US08276452B2 Ultrasonic inspection apparatus 公开/授权日:2012-10-02
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