发明申请
US20100059793A1 InP BASED HETEROJUNCTION BIPOLAR TRANSISTORS WITH EMITTER-UP AND EMITTER-DOWN PROFILES ON A COMMON WAFER 失效
基于InP的异常双极晶体管,在通用波形上具有发射和发射的特性

  • 专利标题: InP BASED HETEROJUNCTION BIPOLAR TRANSISTORS WITH EMITTER-UP AND EMITTER-DOWN PROFILES ON A COMMON WAFER
  • 专利标题(中): 基于InP的异常双极晶体管,在通用波形上具有发射和发射的特性
  • 申请号: US12616374
    申请日: 2009-11-11
  • 公开(公告)号: US20100059793A1
    公开(公告)日: 2010-03-11
  • 发明人: Mary ChenMarko Sokolich
  • 申请人: Mary ChenMarko Sokolich
  • 申请人地址: US CA Malibu
  • 专利权人: HRL LABORATORIES, LLC
  • 当前专利权人: HRL LABORATORIES, LLC
  • 当前专利权人地址: US CA Malibu
  • 主分类号: H01L27/082
  • IPC分类号: H01L27/082 H01L21/8222
InP BASED HETEROJUNCTION BIPOLAR TRANSISTORS WITH EMITTER-UP AND EMITTER-DOWN PROFILES ON A COMMON WAFER
摘要:
A wafer comprising at least one emitter-up Heterojunction Bipolar Transistor (HBT) and at least one emitter-down HBT on a common InP based semiconductor wafer. Isolation and N-type implants into the device layers differentiate an emitter-down HBT from an emitter-up HBT. The method for preparing a device comprises forming identical layers for all HBTs and performing ion implantation to differentiate an emitter-down HBT from an emitter-up HBT.
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