发明申请
US20100073246A1 SYSTEM AND METHOD FOR MEASURING ANTENNA RADIATION PATTERN IN FRESNEL REGION BASED ON PHI-VARIATION METHOD
有权
基于偏差方法测量FRESNEL区域天线辐射图的系统和方法
- 专利标题: SYSTEM AND METHOD FOR MEASURING ANTENNA RADIATION PATTERN IN FRESNEL REGION BASED ON PHI-VARIATION METHOD
- 专利标题(中): 基于偏差方法测量FRESNEL区域天线辐射图的系统和方法
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申请号: US12516825申请日: 2007-11-30
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公开(公告)号: US20100073246A1公开(公告)日: 2010-03-25
- 发明人: Soon-Soo Oh , Yong-Hee Cho , Je-Hoon Yun , Joung-Myoun Kim , Jung-Ick Moon
- 申请人: Soon-Soo Oh , Yong-Hee Cho , Je-Hoon Yun , Joung-Myoun Kim , Jung-Ick Moon
- 优先权: KR10-2006-0121761 20061204
- 国际申请: PCT/KR07/06111 WO 20071130
- 主分类号: G01R29/10
- IPC分类号: G01R29/10
摘要:
Provided is a system and method for measuring an antenna radiation pattern in a Fresnel region based on a phi-variation method. The system includes a rotator for changing angles of a reference antenna and a target antenna; a vector network analyzer for obtaining radiation pattern data in accordance with transmission/reception radio frequency (RF) signals between the reference antenna and the target antenna; a measurement unit for calculating a far-field radiation pattern based on the radiation pattern data received from the vector network analyzer; and a controller for controlling the rotator according to a measurement angle transmitted from the measurement unit.
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