发明申请
- 专利标题： METHOD AND SYSTEM FOR PERFORMING STATISTICAL LEAKAGE CHARACTERIZATION, ANALYSIS, AND MODELING
- 专利标题（中）： 执行统计泄漏特征，分析和建模的方法和系统
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申请号： US12241519申请日： 2008-09-30
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公开(公告)号： US20100083198A1公开(公告)日： 2010-04-01
- 发明人: Lizheng Zhang , Hongliang Chang , Kai-Ti Huang , Vassilios Gerousis
- 申请人： Lizheng Zhang , Hongliang Chang , Kai-Ti Huang , Vassilios Gerousis
- 主分类号： G06F17/50
- IPC分类号： G06F17/50
摘要：
A method, system, and computer program product are disclosed for performing statistical leakage power characterization to estimate yield of a circuit in terms of leakage power. According to some approaches, this is performed with consideration of bi-exponential modeling.
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