Invention Application
US20100102868A1 Hardware and Method to Test Phase Linearity of Phase Synthesizer 失效
测试相位合成器的相位线性度的硬件和方法

Hardware and Method to Test Phase Linearity of Phase Synthesizer
Abstract:
A circuit to test phase linearity of a phase synthesizer, which synthesizes an output clock having a phase corresponding to a digital phase value input to the phase synthesizer. A digital counter provides the digital phase value to the phase synthesizer. The digital counter receives a counter clock synchronized with an input clock. The digital phase value is stepped by the digital counter, thereby shifting the frequency of the output clock. The output clock is analyzed with respect to phase linearity of the phase synthesizer to produce a phase linearity analysis output.
Public/Granted literature
Information query
Patent Agency Ranking
0/0