Invention Application
US20100102868A1 Hardware and Method to Test Phase Linearity of Phase Synthesizer
失效
测试相位合成器的相位线性度的硬件和方法
- Patent Title: Hardware and Method to Test Phase Linearity of Phase Synthesizer
- Patent Title (中): 测试相位合成器的相位线性度的硬件和方法
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Application No.: US12531830Application Date: 2008-03-14
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Publication No.: US20100102868A1Publication Date: 2010-04-29
- Inventor: Jaeha Kim , Hae-Chang Lee , Thomas H. Greer, III
- Applicant: Jaeha Kim , Hae-Chang Lee , Thomas H. Greer, III
- International Application: PCT/US08/56952 WO 20080314
- Main IPC: G06F1/04
- IPC: G06F1/04

Abstract:
A circuit to test phase linearity of a phase synthesizer, which synthesizes an output clock having a phase corresponding to a digital phase value input to the phase synthesizer. A digital counter provides the digital phase value to the phase synthesizer. The digital counter receives a counter clock synchronized with an input clock. The digital phase value is stepped by the digital counter, thereby shifting the frequency of the output clock. The output clock is analyzed with respect to phase linearity of the phase synthesizer to produce a phase linearity analysis output.
Public/Granted literature
- US08155174B2 Hardware and method to test phase linearity of phase synthesizer Public/Granted day:2012-04-10
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