发明申请
- 专利标题: Sample analyzer and calibration method of sample analyzer
- 专利标题(中): 样品分析仪和样品分析仪的校准方法
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申请号: US12589863申请日: 2009-10-28
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公开(公告)号: US20100105142A1公开(公告)日: 2010-04-29
- 发明人: Daigo Fukuma , Masaharu Shibata
- 申请人: Daigo Fukuma , Masaharu Shibata
- 专利权人: Sysmex Corporation
- 当前专利权人: Sysmex Corporation
- 优先权: JP2008-277437 20081028
- 主分类号: G01N31/00
- IPC分类号: G01N31/00 ; G01N33/00
摘要:
A sample analyzer is disclosed that comprises: a first measurement unit for measuring a sample; a second measurement unit for measuring a sample; and an information processing unit for acquiring a first analysis result based on a result of the measurement by the first measurement unit and a second analysis result based on a result of the measurement by the second measurement unit, wherein the information processing unit is configured to: correct the first analysis result based on a first correction value, correct the second analysis result based on a second correction value, update the first correction value, and update the second correction value. A calibration method of a sample analyzer is also disclosed.
公开/授权文献
- US08252593B2 Sample analyzer and calibration method of sample analyzer 公开/授权日:2012-08-28
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