发明申请
US20100105142A1 Sample analyzer and calibration method of sample analyzer 有权
样品分析仪和样品分析仪的校准方法

Sample analyzer and calibration method of sample analyzer
摘要:
A sample analyzer is disclosed that comprises: a first measurement unit for measuring a sample; a second measurement unit for measuring a sample; and an information processing unit for acquiring a first analysis result based on a result of the measurement by the first measurement unit and a second analysis result based on a result of the measurement by the second measurement unit, wherein the information processing unit is configured to: correct the first analysis result based on a first correction value, correct the second analysis result based on a second correction value, update the first correction value, and update the second correction value. A calibration method of a sample analyzer is also disclosed.
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