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发明申请
US20100110786A1 Nonvolatile memory device, memory system including the same, and memory test system 审中-公开
非易失性存储器件，包括相同的存储器系统和存储器测试系统

Nonvolatile memory device, memory system including the same, and memory test system
摘要：
Provided are a nonvolatile memory device and a memory test system. The nonvolatile memory device includes a temperature compensator to calculate a trim value for regulating a characteristic of the nonvolatile memory device that varies with temperature in response to a test signal. The memory test system includes a plurality of nonvolatile memories and a tester. Each of the nonvolatile memories includes a temperature compensator. The tester tests the plurality of nonvolatile memories. The temperature compensator calculates a trim value for regulating a characteristic of the nonvolatile memory device that varies with temperature in response to a test signal of the tester.
摘要（中）：

提供了非易失性存储器件和存储器测试系统。 非易失性存储器件包括温度补偿器，用于根据测试信号计算用于调节随温度变化的非易失性存储器件的特性的微调值。 存储器测试系统包括多个非易失性存储器和测试器。 每个非易失性存储器包括温度补偿器。 测试仪测试多个非易失性存储器。 温度补偿器根据测试仪的测试信号计算用于调节随温度变化的非易失性存储器件的特性的微调值。

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