发明申请
- 专利标题: PHASE DETECTOR CIRCUITRY
- 专利标题(中): 相位检测电路
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申请号: US12346269申请日: 2008-12-30
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公开(公告)号: US20100123482A1公开(公告)日: 2010-05-20
- 发明人: Walter Marton , Robert Braun
- 申请人: Walter Marton , Robert Braun
- 申请人地址: JP Tokyo
- 专利权人: FUJITSU MICROELECTRONICS LIMITED
- 当前专利权人: FUJITSU MICROELECTRONICS LIMITED
- 当前专利权人地址: JP Tokyo
- 优先权: EP08169190.9 20081114
- 主分类号: H03D13/00
- IPC分类号: H03D13/00 ; H03B21/00 ; H03B19/00
摘要:
Phase detector circuitry for a phase-locked loop frequency synthesizer, the phase detector circuitry comprising a reference input configured to receive a reference signal; a feedback input configured to receive a divided signal from divider circuitry in a feedback path of the phase-locked loop; and pulse generation circuitry configured to generate control pulses for controlling a charge pump in the phase-locked loop in accordance with a frequency and phase relationship between the reference signal and the divided signal; wherein the divided signal comprises a pulse having a length shorter than a half period of the divided signal, and wherein the pulse generation circuitry is configured to generate the control pulses by masking the reference signal using the pulse of the divided signal as a mask, so as to define the edges of the control pulses from the edges of the divided signal and an edge of the reference signal.
公开/授权文献
- US07898307B2 Phase detector circuitry 公开/授权日:2011-03-01
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