发明申请
- 专利标题: SYSTEMS AND METHODS FOR INSPECTING AN OBJECT USING ULTRASOUND
- 专利标题(中): 使用超声波检测物体的系统和方法
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申请号: US12277884申请日: 2008-11-25
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公开(公告)号: US20100126277A1公开(公告)日: 2010-05-27
- 发明人: Yanyan Wu , Edward James Nieters , Thomas James Batzinger , Nicholas Joseph Kray , James Norman Barshinger , Jian Li , Waseem Ibrahim Faidi , Prabhjot Singh , Francis Howard Little , Michael Everett Keller , Timothy Jesse Sheets
- 申请人: Yanyan Wu , Edward James Nieters , Thomas James Batzinger , Nicholas Joseph Kray , James Norman Barshinger , Jian Li , Waseem Ibrahim Faidi , Prabhjot Singh , Francis Howard Little , Michael Everett Keller , Timothy Jesse Sheets
- 申请人地址: US NY Schenectady
- 专利权人: GENERAL ELECTRIC COMPANY
- 当前专利权人: GENERAL ELECTRIC COMPANY
- 当前专利权人地址: US NY Schenectady
- 主分类号: G01N29/44
- IPC分类号: G01N29/44 ; G06F17/00
摘要:
An ultrasound inspection system is provided for inspecting an object. The inspection system includes an ultrasound probe configured to scan the object and acquire a plurality of ultrasound scan data. The inspection system further includes a processor coupled to the ultrasound probe and configured to apply a transfer function to the ultrasound scan data to compensate for distortion of a plurality of ultrasound signals through the object and thereby generate a plurality of compensated ultrasound scan data, and to process the compensated ultrasonic scan data to characterize a feature in the object.
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