发明申请
- 专利标题: ELECTRONIC COMPONENT TESTER
- 专利标题(中): 电子元件测试仪
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申请号: US12579955申请日: 2009-10-15
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公开(公告)号: US20100127712A1公开(公告)日: 2010-05-27
- 发明人: Takanori Miya , Isao Hayami , Shoichi Tanaka
- 申请人: Takanori Miya , Isao Hayami , Shoichi Tanaka
- 优先权: JP2008-302369 20081127; JP2009-203632 20090903
- 主分类号: G01R31/02
- IPC分类号: G01R31/02
摘要:
The electronic component tester includes: a socket configured to supply power to connection terminals for operating an electronic component; an electronic component mount member on which the electronic component is to be mounted; and a temperature adjusting member which is configured to come into contact with the electronic component mount member to keep the electronic component at a predetermined temperature. The electronic component mount member includes a heat transfer plate on which the electronic component is to be mounted and which is configured to come into contact with the temperature adjusting member, and an electronic component cover for covering the electronic component. The heat transfer plate includes through holes.
公开/授权文献
- US07994804B2 Electronic component tester 公开/授权日:2011-08-09
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