发明申请
- 专利标题： METHOD AND SYSTEM FOR OPTIMIZING MEASUREMENT REPORTING MECHANISM IN A LAYERED PROTOCOL WIRELESS NETWORK
- 专利标题（中）： 在层状无线网络中优化测量报告机制的方法和系统
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申请号： US12628629申请日： 2009-12-01
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公开(公告)号： US20100136920A1公开(公告)日： 2010-06-03
- 发明人: Vinay Kumar Shrivastava , Akhil Madan Panchabhai , Kundan Kumar Lucky
- 申请人： Vinay Kumar Shrivastava , Akhil Madan Panchabhai , Kundan Kumar Lucky
- 申请人地址： KR Gyeonggi-do
- 专利权人： Samsung Electronics Co., Ltd.
- 当前专利权人： Samsung Electronics Co., Ltd.
- 当前专利权人地址： KR Gyeonggi-do
- 优先权： IN3015/CHE/2008 20081201
- 主分类号： H04B17/00
- IPC分类号： H04B17/00
摘要：
A method and a system for optimizing a measurement reporting mechanism in a wireless network is provided. The method includes receiving a measurement report message from a radio resource control layer and storing the measurement report message in a radio link control layer. The method also includes checking for invalid measurement report messages by the radio resource control layer. Further, the method also includes indicating to the radio link control layer to discard invalid measurement report messages and discarding the measurement report message based on the indication.
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