发明申请
US20100146320A1 Memory Access Time Measurement Using Phase Detector 失效
使用相位检测器进行存储器访问时间测量

Memory Access Time Measurement Using Phase Detector
摘要:
Methods and systems for determining a memory access time are provided. A first phase skew is measured between a first clock signal used by a memory and a second clock signal used as a reference clock signal. Then, a second phase skew is measured between a delayed version of the first clock signal output by the memory when the memory completes a given read operation and the second clock signal. The memory access time is determined based on the first and second phase skews.
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