Invention Application
- Patent Title: CMOS image sensors
- Patent Title (中): CMOS图像传感器
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Application No.: US12654234Application Date: 2009-12-15
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Publication No.: US20100155797A1Publication Date: 2010-06-24
- Inventor: Jun-Taek Lee , Jun-Pyo Ko , Ji-Hoon Jung , Myoung-Bae Won
- Applicant: Jun-Taek Lee , Jun-Pyo Ko , Ji-Hoon Jung , Myoung-Bae Won
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Priority: KR10-2008-0133536 20081224
- Main IPC: H01L31/112
- IPC: H01L31/112 ; H01L31/0232

Abstract:
CMOS image sensors and methods of manufacturing the same are provided, the CMOS image sensors include an epitaxial layer, a photodiode, a transfer transistor, CMOS transistors, first metal wirings and a second metal wiring formed on a substrate. The substrate may have a photodiode region, a floating diffusion region, an active pixel sensor (APS) array circuit region and a peripheral circuit region. The photodiode may be formed on the epitaxial layer in the photodiode region. The transfer transistor may be formed on the epitaxial layer in the floating diffusion region. The CMOS transistors may be formed on the epitaxial layer in the APS array circuit region and the peripheral circuit region. The first metal wirings may be formed over the photodiode region. The second metal wiring may be formed on one of the first metal wirings. The second metal wiring may be located higher than the first metal wirings.
Information query
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