发明申请
US20100157406A1 SYSTEM AND METHOD FOR MATCHING LIGHT SOURCE EMISSION TO DISPLAY ELEMENT REFLECTIVITY
审中-公开
用于匹配光源发射到显示元件反射率的系统和方法
- 专利标题: SYSTEM AND METHOD FOR MATCHING LIGHT SOURCE EMISSION TO DISPLAY ELEMENT REFLECTIVITY
- 专利标题(中): 用于匹配光源发射到显示元件反射率的系统和方法
-
申请号: US12340497申请日: 2008-12-19
-
公开(公告)号: US20100157406A1公开(公告)日: 2010-06-24
- 发明人: Russell Wayne Gruhlke , Ion Bita , Kollengode S. Narayanan , Lai Wang , John Joseph Hannan , Gang Xu , Chong Lee
- 申请人: Russell Wayne Gruhlke , Ion Bita , Kollengode S. Narayanan , Lai Wang , John Joseph Hannan , Gang Xu , Chong Lee
- 申请人地址: US CA San Diego
- 专利权人: QUALCOMM MEMS Technologies, Inc.
- 当前专利权人: QUALCOMM MEMS Technologies, Inc.
- 当前专利权人地址: US CA San Diego
- 主分类号: G02F1/21
- IPC分类号: G02F1/21
摘要:
Systems and methods for illuminating interferometric modulator reflective displays are disclosed. One embodiment includes a display including a plurality of interferometric modulators configured to reflect a spectrum of radiation having a reflectance response peak at one or more wavelengths. A plurality of quantum dots are configured to emit radiation having a peak wavelength substantially at said one or more wavelengths, and the display is configured such that light emitted from the quantum dots irradiates the plurality of interferometric modulators.
信息查询