发明申请
US20100162789A1 APPARATUS FOR DROP TESTING AND METHOD UTILIZING THE SAME 失效
用于堕落测试的装置和使用它的方法

  • 专利标题: APPARATUS FOR DROP TESTING AND METHOD UTILIZING THE SAME
  • 专利标题(中): 用于堕落测试的装置和使用它的方法
  • 申请号: US12344279
    申请日: 2008-12-25
  • 公开(公告)号: US20100162789A1
    公开(公告)日: 2010-07-01
  • 发明人: TING-FENG SU
  • 申请人: TING-FENG SU
  • 申请人地址: TW Hsinchu
  • 专利权人: POWERTECH TECHNOLOGY INC
  • 当前专利权人: POWERTECH TECHNOLOGY INC
  • 当前专利权人地址: TW Hsinchu
  • 主分类号: G01N3/00
  • IPC分类号: G01N3/00
APPARATUS FOR DROP TESTING AND METHOD UTILIZING THE SAME
摘要:
An apparatus for drop testing is disclosed. The apparatus has a drop angle setting jig that horizontally moves on a support frame and positions a test object at a predetermined angle by clamping with a fixture. The jig provides a second datum plane and is connected to a moveable holding frame, with the holding frame providing a first datum plane. After the fixture clamps the testing object, the jig can be pulled back without touching the testing object, and the testing object stays still. Therefore, the testing object can be precisely positioned. Furthermore, with the sliding track and the stopping block, the jig is able to quickly return back to the reference position.
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