Invention Application
- Patent Title: REFRACTIVE INDEX DISTRIBUTION MEASUREMENT METHOD AND REFRACTIVE INDEX DISTRIBUTION MEASUREMENT APPARATUS
- Patent Title (中): 折射指数分布测量方法和折射率分布测量装置
-
Application No.: US12644714Application Date: 2009-12-22
-
Publication No.: US20100165355A1Publication Date: 2010-07-01
- Inventor: Seima Kato
- Applicant: Seima Kato
- Applicant Address: JP Tokyo
- Assignee: CANON KABUSHIKI KAISHA
- Current Assignee: CANON KABUSHIKI KAISHA
- Current Assignee Address: JP Tokyo
- Priority: JP2008-329274 20081225
- Main IPC: G01N21/41
- IPC: G01N21/41 ; G01B9/02
Abstract:
A refractive index distribution measurement method includes the steps of measuring a first transmission wavefront of a test object by introducing reference light to the test object immersed in a first medium having a first refractive index lower than that of the test object by 0.01 or more, measuring a second transmission wavefront of the test object by introducing the reference light to the test object immersed in a second medium having a second refractive index lower than that of the test object by 0.01 or more and different from the first refractive index, and obtaining a refractive index distribution of the test object based on a measurement result of the first transmission wavefront and a measurement result of the second transmission wavefront.
Public/Granted literature
Information query
