Invention Application
US20100188660A1 SPATIAL FREQUENCY OPTICAL MEASUREMENT INSTRUMENT AND METHOD 有权
空间光学测量仪器和方法

  • Patent Title: SPATIAL FREQUENCY OPTICAL MEASUREMENT INSTRUMENT AND METHOD
  • Patent Title (中): 空间光学测量仪器和方法
  • Application No.: US12668926
    Application Date: 2008-07-15
  • Publication No.: US20100188660A1
    Publication Date: 2010-07-29
  • Inventor: Perry A. Palumbo
  • Applicant: Perry A. Palumbo
  • Applicant Address: US CO Loveland
  • Assignee: Hach Company
  • Current Assignee: Hach Company
  • Current Assignee Address: US CO Loveland
  • International Application: PCT/US08/70055 WO 20080715
  • Main IPC: G01N21/59
  • IPC: G01N21/59 G01N21/55
SPATIAL FREQUENCY OPTICAL MEASUREMENT INSTRUMENT AND METHOD
Abstract:
A spatial frequency optical measurement instrument (100) is provided according to the invention. The instrument (100) includes a spatial frequency mask (120) positioned in a light path and configured to encode light with spatial frequency information, a light receiver (140) positioned to receive the light encoded with the spatial frequency information, wherein the light encoded with the spatial frequency information has been interacted with a sample material, and a processing system (180) coupled to the light receiver (140) and configured to determine a change in the spatial frequency information due to the interaction of the light with the sample material.
Public/Granted literature
Information query
Patent Agency Ranking
0/0