Invention Application
- Patent Title: SPATIAL FREQUENCY OPTICAL MEASUREMENT INSTRUMENT AND METHOD
- Patent Title (中): 空间光学测量仪器和方法
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Application No.: US12668926Application Date: 2008-07-15
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Publication No.: US20100188660A1Publication Date: 2010-07-29
- Inventor: Perry A. Palumbo
- Applicant: Perry A. Palumbo
- Applicant Address: US CO Loveland
- Assignee: Hach Company
- Current Assignee: Hach Company
- Current Assignee Address: US CO Loveland
- International Application: PCT/US08/70055 WO 20080715
- Main IPC: G01N21/59
- IPC: G01N21/59 ; G01N21/55

Abstract:
A spatial frequency optical measurement instrument (100) is provided according to the invention. The instrument (100) includes a spatial frequency mask (120) positioned in a light path and configured to encode light with spatial frequency information, a light receiver (140) positioned to receive the light encoded with the spatial frequency information, wherein the light encoded with the spatial frequency information has been interacted with a sample material, and a processing system (180) coupled to the light receiver (140) and configured to determine a change in the spatial frequency information due to the interaction of the light with the sample material.
Public/Granted literature
- US08208144B2 Spatial frequency optical measurement instrument and method Public/Granted day:2012-06-26
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