发明申请
- 专利标题： Measurement of Lead by X-Ray Fluorescence
- 专利标题（中）： 通过X射线荧光测量铅
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申请号： US12726306申请日： 2010-03-17
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公开(公告)号： US20100189215A1公开(公告)日： 2010-07-29
- 发明人: Lee GRODZINS , John Pesce
- 申请人： Lee GRODZINS , John Pesce
- 主分类号： G01N23/223
- IPC分类号： G01N23/223
摘要：
A method, instrument, and computer program software product for characterizing a sample with respect to the presence of a specified element, either as a constituent of a surface layer or of the bulk of the sample. Intensities of fluorescent emission at two characteristic emission lines are compared to establish whether the specified element is disposed above the bulk of the sample. In the case where the specified element is disposed above the bulk of the sample, an areal density of the specified element is determined, whereas in the case where the specified element is disposed within the bulk of the sample, a volumetric concentration of the specified element within the sample is determined.
公开/授权文献
- US07933379B2 Measurement of lead by X-ray fluorescence 公开/授权日：2011-04-26
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