发明申请
US20100193215A1 STRUCTURE COMPRISING A GETTER LAYER AND AN ADJUSTING SUBLAYER AND FABRICATION PROCESS 有权
结构包括一个入口层和一个调整子层和制造过程

  • 专利标题: STRUCTURE COMPRISING A GETTER LAYER AND AN ADJUSTING SUBLAYER AND FABRICATION PROCESS
  • 专利标题(中): 结构包括一个入口层和一个调整子层和制造过程
  • 申请号: US12679487
    申请日: 2008-10-09
  • 公开(公告)号: US20100193215A1
    公开(公告)日: 2010-08-05
  • 发明人: Xavier Baillin
  • 申请人: Xavier Baillin
  • 申请人地址: FR Paris
  • 专利权人: COMMISSARIAT A L'ENERGIE ATOMIQUE
  • 当前专利权人: COMMISSARIAT A L'ENERGIE ATOMIQUE
  • 当前专利权人地址: FR Paris
  • 优先权: FR0707212 20071015
  • 国际申请: PCT/FR2008/001420 WO 20081009
  • 主分类号: H05K5/06
  • IPC分类号: H05K5/06
STRUCTURE COMPRISING A GETTER LAYER AND AN ADJUSTING SUBLAYER AND FABRICATION PROCESS
摘要:
The structure comprises at least a device, for example a microelectronic chip, and at least a getter arranged in a cavity under a controlled atmosphere delineated by a substrate and a sealing cover. The getter comprises at least one preferably metallic getter layer, and an adjustment sub-layer made from pure metal, situated between the getter layer and the substrate, on which it is formed. The adjustment sub-layer is designed to modulate the activation temperature of the getter layer. The getter layer comprises two elementary getter layers.
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