发明申请
US20100214937A1 Rank Indicator Offset for Periodic CQI Reporting with Periodicity of One
审中-公开
周期性CQI报告的秩指标偏移量
- 专利标题： Rank Indicator Offset for Periodic CQI Reporting with Periodicity of One
- 专利标题（中）： 周期性CQI报告的秩指标偏移量
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申请号： US12685474申请日： 2010-01-11
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公开(公告)号： US20100214937A1公开(公告)日： 2010-08-26
- 发明人: Runhua Chen , Zukang Shen , Eko N. Onggosanusi
- 申请人： Runhua Chen , Zukang Shen , Eko N. Onggosanusi
- 申请人地址： US TX Dallas
- 专利权人： Texas Instruments Incorporated
- 当前专利权人： Texas Instruments Incorporated
- 当前专利权人地址： US TX Dallas
- 主分类号： H04L12/26
- IPC分类号： H04L12/26
摘要：
This invention prevents a periodically reported Rank Indicator from interfering with a similarly periodically reported wideband and subband channel quality indicator. Such interference is disadvantageous because it may eliminate wideband channel quality indicator reporting or eliminate each first bandwidth part of subband channel quality indicator reporting. Proper selection of the rank indicator reporting periodicity and offset relative to the wideband and subband channel quality indicator reporting periodicity prevents this interference.
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