发明申请
US20100216258A1 METHOD FOR MEASURING DOPANT CONCENTRATION DURING PLASMA ION IMPLANTATION
有权
在等离子体植入过程中测量痰浓度的方法
- 专利标题: METHOD FOR MEASURING DOPANT CONCENTRATION DURING PLASMA ION IMPLANTATION
- 专利标题(中): 在等离子体植入过程中测量痰浓度的方法
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申请号: US12777085申请日: 2010-05-10
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公开(公告)号: US20100216258A1公开(公告)日: 2010-08-26
- 发明人: Majeed A. Foad , Shijian Li
- 申请人: Majeed A. Foad , Shijian Li
- 专利权人: APPLIED MATERIALS, INC.
- 当前专利权人: APPLIED MATERIALS, INC.
- 主分类号: H01L21/66
- IPC分类号: H01L21/66
摘要:
Embodiments of the invention generally provide methods for end point detection at predetermined dopant concentrations during plasma doping processes. In one embodiment, a method includes positioning a substrate within a process chamber, generating a plasma above the substrate and transmitting a light generated by the plasma through the substrate, wherein the light enters the topside and exits the backside of the substrate, and receiving the light by a sensor positioned below the substrate. The method further provides generating a signal proportional to the light received by the sensor, implanting the substrate with a dopant during a doping process, generating multiple light signals proportional to a decreasing amount of the light received by the sensor during the doping process, generating an end point signal proportional to the light received by the sensor once the substrate has a final dopant concentration, and ceasing the doping process.
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