发明申请
- 专利标题： SUBSTRATE WITH TEST CIRCUIT
- 专利标题（中）： 带测试电路的基板
-
申请号： US12718451申请日： 2010-03-05
-
公开(公告)号： US20100224875A1公开(公告)日： 2010-09-09
- 发明人: Yupeng CHEN , Hua LIU , Haoran GAO , Yu LU
- 申请人： Yupeng CHEN , Hua LIU , Haoran GAO , Yu LU
- 申请人地址： CN Beijing
- 专利权人： BEIJING BOE OPTOELECTRONICS TECHNOLOGY CO., LTD.
- 当前专利权人： BEIJING BOE OPTOELECTRONICS TECHNOLOGY CO., LTD.
- 当前专利权人地址： CN Beijing
- 优先权： CN200910079296.X 20090306
- 主分类号： H01L23/522
- IPC分类号： H01L23/522
摘要：
The present invention relates to a substrate with a substrate test circuit. In an embodiment, by making the length of the wiring from a first data-line-test input terminal to a first panel equal to that of the wiring from a second data-line-test input terminal to the first panel, the input resistances between two test input terminals of a first data-line-test line and the first panel are identical, and thus when a data line of the first panel is detected, the voltage drops of test signals inputted from the two test input terminals are the same, and the test signals actually loaded to the first panel are the same and the detecting abilities are identical.
公开/授权文献
- US08487643B2 Substrate with test circuit 公开/授权日：2013-07-16
信息查询
IPC分类:
