发明申请
- 专利标题： DETECTION METHOD FOR DEFECT OF SENSOR
- 专利标题（中）： 传感器缺陷检测方法
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申请号： US12688956申请日： 2010-01-18
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公开(公告)号： US20100225339A1公开(公告)日： 2010-09-09
- 发明人: Tomohisa Fujita , Takeshi Kawai , Satoshi Teramoto , Shigeki Mori
- 申请人： Tomohisa Fujita , Takeshi Kawai , Satoshi Teramoto , Shigeki Mori
- 专利权人： NGK SPARK PLUG CO, LTD.
- 当前专利权人： NGK SPARK PLUG CO, LTD.
- 优先权： JPJP2009-008506 20090119; JPJP2010-007731 20100115
- 主分类号： G01R27/08
- IPC分类号： G01R27/08
摘要：
A defect detection method for a sensor in which a fixing member provides a seal between a sensor element and tubular metallic members, the method being capable of detecting breakage of a conductor caused by breakage of the element.
公开/授权文献
- US08513961B2 Detection method for defect of sensor 公开/授权日：2013-08-20
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