An electroluminescent (EL) subpixel, such as an organic light-emitting diode (OLED) subpixel, is compensated for aging effects such as threshold voltage Vth shift, EL voltage Voled shift, and OLED efficiency loss. The drive current of the subpixel is measured at one or more measurement reference gate voltages to form a status signal representing the characteristics of the drive transistor and EL emitter of the subpixel. Current measurements are taken in the linear region of drive transistor operation to improve signal-to-noise ratio in systems such as modern LTPS PMOS OLED displays, which have relatively small Voled shift over their lifetimes and thus relatively small current change due to channel-length modulation. Various sources of noise are also suppressed to further increase signal-to-noise ratio.