发明申请
- 专利标题: PARTICULATE MATTER DETECTION DEVICE
- 专利标题(中): 颗粒物检测装置
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申请号: US12715598申请日: 2010-03-02
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公开(公告)号: US20100229724A1公开(公告)日: 2010-09-16
- 发明人: Masahiro TOKUDA , Atsuo Kondo , Takeshi Sakuma , Takashi Egami
- 申请人: Masahiro TOKUDA , Atsuo Kondo , Takeshi Sakuma , Takashi Egami
- 申请人地址: JP Nagoya-City
- 专利权人: NGK Insulators, Ltd.
- 当前专利权人: NGK Insulators, Ltd.
- 当前专利权人地址: JP Nagoya-City
- 优先权: JP2009-058845 20090312
- 主分类号: B03C3/45
- IPC分类号: B03C3/45 ; B03C3/68
摘要:
A particulate matter detection device (100) includes a first electrode (10) that includes a conductive section (12) and a dielectric (14) that covers the conductive section (12), and a second electrode (20) that is disposed opposite to the first electrode (10) at an interval of 0.3 to 3.0 mm. Charged particulate matter contained in a fluid that passes through the space between the first electrode (10) and the second electrode (20), or particulate matter that is contained in a fluid and charged by a discharge that occurs due to application of a voltage between the electrodes (10) and (20) is electrically adsorbed on at least one of the electrodes (10) and (20), and the particulate matter adsorbed on the electrodes (10) and (20) is detected by measuring a change in electrical properties of the first electrode (10), or a change in electrical properties of the electrodes (10) and (20).
公开/授权文献
- US08366813B2 Particulate matter detection device 公开/授权日:2013-02-05
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