发明申请
- 专利标题: SENSOR ELEMENT FOR SPR MEASUREMENT
- 专利标题(中): 传感器元件用于SPR测量
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申请号: US12303693申请日: 2007-06-26
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公开(公告)号: US20100233028A1公开(公告)日: 2010-09-16
- 发明人: Yuzuru Iwasaki , Michiko Seyama , Toru Miura , Tsutomu Horiuchi , Tsuneyuki Haga , Serge Camou
- 申请人: Yuzuru Iwasaki , Michiko Seyama , Toru Miura , Tsutomu Horiuchi , Tsuneyuki Haga , Serge Camou
- 申请人地址: JP Tokyo
- 专利权人: NIPPON TELEGRAPH AND TELEPHONE CORPORATION
- 当前专利权人: NIPPON TELEGRAPH AND TELEPHONE CORPORATION
- 当前专利权人地址: JP Tokyo
- 优先权: JP2006-175684 20060626
- 国际申请: PCT/JP2007/062758 WO 20070626
- 主分类号: G01N30/00
- IPC分类号: G01N30/00
摘要:
An object of the present invention is to provide an element for SPR measurement without the need of a mechanical solution-sending mechanism. The scope of the present invention is defined by a sensor element for surface plasmon resonance (SPR) measurement utilizing an SPR effect, wherein the sensor element comprises a transparent substrate, a gold thin film formed on at least a part of the transparent substrate, and a thin film with affinity for a sample provided on the transparent substrate having the gold thin film formed on at least a part thereof, and the thin film with affinity for a sample has a measurement region (region A), a sample introduction section (region B) and a sample absorption section (region C) provided with the region A therebetween, the region A is provided with a sample measurement section containing a molecule-recognizing film, an introduction port is formed on the film with affinity for a sample in the region B, an absorption pad is provided on the film with affinity for a sample in the region C so that the whole region C should be covered, and a point in the region B, a point in the region A, and a point in the region C exist in one straight line on the thin film with affinity for a sample.
公开/授权文献
- US08916389B2 Sensor element for SPR measurement 公开/授权日:2014-12-23
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