发明申请
- 专利标题： SIGNAL QUALITY MEASURING APPARATUS AND METHOD THEREOF
- 专利标题（中）： 信号质量测量装置及其方法
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申请号： US12726374申请日： 2010-03-18
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公开(公告)号： US20100238989A1公开(公告)日： 2010-09-23
- 发明人: Hyun-soo PARK , Kyung-geum Lee , In-oh Hwang , Hui Zhao , Jong-hyun Shin
- 申请人： Hyun-soo PARK , Kyung-geum Lee , In-oh Hwang , Hui Zhao , Jong-hyun Shin
- 申请人地址： KR Suwon-si
- 专利权人： Samsung Electronics Co., LTD
- 当前专利权人： Samsung Electronics Co., LTD
- 当前专利权人地址： KR Suwon-si
- 优先权： KR10-2009-0106666 20091105
- 主分类号： H04B17/00
- IPC分类号： H04B17/00 ; H04L27/01
摘要：
A signal quality measuring apparatus includes a binary signal generating unit to generate a binary signal from an input signal; a level information extracting unit to extract level information from a relationship between the input signal and the binary signal using at least two window lengths; and a quality calculating unit to calculate a quality of the input signal based on the level information.
公开/授权文献
- US08804799B2 Signal quality measuring apparatus and method thereof 公开/授权日：2014-08-12