发明申请
- 专利标题: SCRUB INDUCING COMPLIANT ELECTRICAL CONTACT
- 专利标题(中): SCRUB诱导合规电气接触
-
申请号: US12629790申请日: 2009-12-02
-
公开(公告)号: US20100244875A1公开(公告)日: 2010-09-30
- 发明人: Scott Chabineau-Lovgren , Steve B. Sargeant , Mark A. Swart
- 申请人: Scott Chabineau-Lovgren , Steve B. Sargeant , Mark A. Swart
- 主分类号: G01R1/067
- IPC分类号: G01R1/067
摘要:
The contact assembly having a contact member with a contact tip positioned within holes in a test socket or probe plate wherein the contact tip or the hole in the probe plate or test socket has a cam surface to provide lateral movement of the contact tip across a surface of a test location during compression of the contact member to induce scrubbing on the surface of the test site.
公开/授权文献
- US08324919B2 Scrub inducing compliant electrical contact 公开/授权日:2012-12-04
信息查询