发明申请
US20100244875A1 SCRUB INDUCING COMPLIANT ELECTRICAL CONTACT 有权
SCRUB诱导合规电气接触

SCRUB INDUCING COMPLIANT ELECTRICAL CONTACT
摘要:
The contact assembly having a contact member with a contact tip positioned within holes in a test socket or probe plate wherein the contact tip or the hole in the probe plate or test socket has a cam surface to provide lateral movement of the contact tip across a surface of a test location during compression of the contact member to induce scrubbing on the surface of the test site.
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