发明申请
- 专利标题: PROFILING IN A MASSIVE PARALLEL PROCESSING ENVIRONMENT
- 专利标题(中): 在大型平行处理环境中进行分析
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申请号: US12413289申请日: 2009-03-27
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公开(公告)号: US20100250563A1公开(公告)日: 2010-09-30
- 发明人: Wu Cao , Sridhar Ganti , Balaji Gadhiraju
- 申请人: Wu Cao , Sridhar Ganti , Balaji Gadhiraju
- 申请人地址: DE Walldorf
- 专利权人: SAP AG
- 当前专利权人: SAP AG
- 当前专利权人地址: DE Walldorf
- 主分类号: G06F17/30
- IPC分类号: G06F17/30 ; G06F7/14 ; G06F7/16
摘要:
A computer-implemented method of profiling a data set in a parallel processing environment includes vertically partitioning an initial data set. One or more attribute subsets are then profiled. A list of subjects is generated each corresponding to a specific attribute value identified in the profiling. Values of multiple attributes are extracted for each identified subject, and the sample results are assembled and merged.
公开/授权文献
- US09251212B2 Profiling in a massive parallel processing environment 公开/授权日:2016-02-02
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