发明申请
US20100267232A1 Transitional Interface Between Metal and Dielectric in Interconnect Structures 有权
互连结构中金属与介质之间的过渡接口

Transitional Interface Between Metal and Dielectric in Interconnect Structures
摘要:
An integrated circuit structure and methods for forming the same are provided. The integrated circuit structure includes a semiconductor substrate; a dielectric layer over the semiconductor substrate; an opening in the dielectric layer; a conductive line in the opening; a metal alloy layer overlying the conductive line; a first metal silicide layer overlying the metal alloy layer; and a second metal silicide layer different from the first metal silicide layer on the first metal silicide layer. The metal alloy layer and the first and the second metal silicide layers are substantially vertically aligned to the conductive line.
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