发明申请
- 专利标题: Transitional Interface Between Metal and Dielectric in Interconnect Structures
- 专利标题(中): 互连结构中金属与介质之间的过渡接口
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申请号: US12823649申请日: 2010-06-25
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公开(公告)号: US20100267232A1公开(公告)日: 2010-10-21
- 发明人: Chien-Hsueh Shih , Shau-Lin Shue
- 申请人: Chien-Hsueh Shih , Shau-Lin Shue
- 申请人地址: TW Hsin-Chu
- 专利权人: Taiwan Semiconductor Manufacturing Company, Ltd.
- 当前专利权人: Taiwan Semiconductor Manufacturing Company, Ltd.
- 当前专利权人地址: TW Hsin-Chu
- 主分类号: H01L21/768
- IPC分类号: H01L21/768
摘要:
An integrated circuit structure and methods for forming the same are provided. The integrated circuit structure includes a semiconductor substrate; a dielectric layer over the semiconductor substrate; an opening in the dielectric layer; a conductive line in the opening; a metal alloy layer overlying the conductive line; a first metal silicide layer overlying the metal alloy layer; and a second metal silicide layer different from the first metal silicide layer on the first metal silicide layer. The metal alloy layer and the first and the second metal silicide layers are substantially vertically aligned to the conductive line.
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