发明申请
US20100267291A1 SWAGING PROCESS FOR IMPROVED COMPLIANT CONTACT ELECTRICAL TEST PERFORMANCE
审中-公开
改进合规接触电流测试性能的改进方法
- 专利标题： SWAGING PROCESS FOR IMPROVED COMPLIANT CONTACT ELECTRICAL TEST PERFORMANCE
- 专利标题（中）： 改进合规接触电流测试性能的改进方法
-
申请号： US12707596申请日： 2010-02-17
-
公开(公告)号： US20100267291A1公开(公告)日： 2010-10-21
- 发明人: Scott Chabineau-Lovgren , Steve B. Sargeant , Mark A. Swart
- 申请人： Scott Chabineau-Lovgren , Steve B. Sargeant , Mark A. Swart
- 主分类号： H01R4/48
- IPC分类号： H01R4/48 ; H01R43/16
摘要：
A spring contact assembly having a first plunger with a tail portion having a flat contact surface and a swagable surface and a second plunger having a tail portion with a flat contact surface and a swagable surface wherein the flat contact surfaces are overlapping and are surrounded by an external compression spring such that the swagable surfaces are swaged by the coils of the spring during the initial compression of the spring.
信息查询
