发明申请
- 专利标题： DRAM TEMPERATURE MEASUREMENT SYSTEM
- 专利标题（中）： DRAM温度测量系统
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申请号： US12838211申请日： 2010-07-16
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公开(公告)号： US20100277222A1公开(公告)日： 2010-11-04
- 发明人: Sugato Mukherjee
- 申请人： Sugato Mukherjee
- 申请人地址： US ID Boise
- 专利权人： Micron Technology, Inc.
- 当前专利权人： Micron Technology, Inc.
- 当前专利权人地址： US ID Boise
- 主分类号： H01L37/00
- IPC分类号： H01L37/00
摘要：
A converter comprising a comparator having a first input operable to receive a first signal, a second input operable to receive a second signal, and an output, a switch for sinking a portion of the first signal, wherein the switch is responsive to the output, and an integrator connected to the first input, wherein the first signal is a voltage developed by the integrator when a current proportional to the absolute temperature is applied thereto. A method for measuring temperature of a device using a comparator and converting the bitstream of the comparator to a digital output is also given. Because of the rules governing abstracts, this abstract should not be used to construe the claims.
公开/授权文献
- US08162540B2 DRAM temperature measurement system 公开/授权日：2012-04-24
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