发明申请
- 专利标题: APPARATUS AND METHOD FOR MEASURING SIGNAL QUALITY
- 专利标题(中): 用于测量信号质量的装置和方法
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申请号: US12833793申请日: 2010-07-09
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公开(公告)号: US20100278027A1公开(公告)日: 2010-11-04
- 发明人: Hyun-soo PARK , Jae-seong Shim , Jae-wook Lee , Jung-hyun Lee , Eun-jin Ryu , Eing-seob Cho
- 申请人: Hyun-soo PARK , Jae-seong Shim , Jae-wook Lee , Jung-hyun Lee , Eun-jin Ryu , Eing-seob Cho
- 申请人地址: KR Suwon-si
- 专利权人: SAMSUNG ELECTRONICS CO., LTD.
- 当前专利权人: SAMSUNG ELECTRONICS CO., LTD.
- 当前专利权人地址: KR Suwon-si
- 优先权: KR2003-64158 20030916
- 主分类号: H04B17/00
- IPC分类号: H04B17/00 ; G11B7/00 ; G11B27/36
摘要:
An apparatus and method for measuring the quality of a signal on an optical disc based on level information of a viterbi decoder are provided. The signal quality measuring apparatus includes: a binary unit that generates binary signals from input RF signals; a channel identifier that receives the input RF signals and the binary signals output from the binary unit and outputs reference level values corresponding to the binary signals; and an information calculator that receives the reference level values and detects a signal quality value.
公开/授权文献
- US07952974B2 Apparatus and method for measuring signal quality 公开/授权日:2011-05-31