发明申请
- 专利标题: METHOD AND SYSTEM TO ENHANCE RELIABILITY OF SWITCH ARRAY
- 专利标题(中): 提高开关阵列可靠性的方法和系统
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申请号: US12474299申请日: 2009-05-29
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公开(公告)号: US20100302691A1公开(公告)日: 2010-12-02
- 发明人: William James Premerlani , Marco Francesco Aimi , Bo Li , Kanakasabapathi Subramanian
- 申请人: William James Premerlani , Marco Francesco Aimi , Bo Li , Kanakasabapathi Subramanian
- 申请人地址: US NY SCHENECTADY
- 专利权人: GENERAL ELECTRIC COMPANY
- 当前专利权人: GENERAL ELECTRIC COMPANY
- 当前专利权人地址: US NY SCHENECTADY
- 主分类号: H01H9/30
- IPC分类号: H01H9/30 ; H01H9/54
摘要:
A method to reduce an inductive voltage surge across a switch array is disclosed. The method comprises the steps of, (a) directing at least a portion of an electric current away from at least a portion of said switch array; and (b) independently opening different portions of the switch array. A system to reduce an inductive voltage surge across an electrical device comprising a current bypass circuit is also disclosed.
公开/授权文献
- US08427792B2 Method and system to enhance reliability of switch array 公开/授权日:2013-04-23
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