发明申请
- 专利标题: Apparatus and Method for Enhancing the Electromagnetic Signal of a Sample
- 专利标题(中): 用于增强样品电磁信号的装置和方法
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申请号: US12787702申请日: 2010-05-26
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公开(公告)号: US20100315627A1公开(公告)日: 2010-12-16
- 发明人: Wen-Li Wu , Shuhul Kang
- 申请人: Wen-Li Wu , Shuhul Kang
- 主分类号: G01N21/01
- IPC分类号: G01N21/01 ; B05D3/00
摘要:
The present invention is an apparatus and method for enhancing the electromagnetic signal of a sample for ellipsometry which uses at least one auxiliary layer and at least one substrate layer.
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