发明申请
- 专利标题: SYSTEM FOR TESTING POWER SUPPLY UNIT
- 专利标题(中): 用于测试电源单元的系统
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申请号: US12557531申请日: 2009-09-11
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公开(公告)号: US20100315749A1公开(公告)日: 2010-12-16
- 发明人: LING-YU XIE , SHENG-CHUNG HUANG , KUN-LUNG WU
- 申请人: LING-YU XIE , SHENG-CHUNG HUANG , KUN-LUNG WU
- 申请人地址: CN Shenzhen City TW Tu-Cheng
- 专利权人: HONG FU JIN PRECISION INDUSTRY (ShenZhen) CO., LTD.,HON HAI PRECISION INDUSTRY CO., LTD.
- 当前专利权人: HONG FU JIN PRECISION INDUSTRY (ShenZhen) CO., LTD.,HON HAI PRECISION INDUSTRY CO., LTD.
- 当前专利权人地址: CN Shenzhen City TW Tu-Cheng
- 优先权: CN200910303153.2 20090611
- 主分类号: H02H3/20
- IPC分类号: H02H3/20
摘要:
A system for testing a power supply unit includes a test sub-system and a test control sub-system connected to the test sub-system and the power supply unit. The test sub-system perform tests and record the results. The test control sub-system is capable of selecting test items to test the power supply unit and setting an execution sequence of the test items. The test items includes a standby test item for testing the power supply unit at a standby state, a normal test item for testing the power supply unit at a normal state, and an over temperature protection test item for testing the power supply unit at an over heated state. The test control sub-system is further capable of automatically switching the standby test item to the normal test item, and switching the normal test item to the over temperature protection test item.
公开/授权文献
- US08305107B2 System for testing a power supply unit 公开/授权日:2012-11-06