发明申请
- 专利标题: HIGH THROUGHPUT SEM TOOL
- 专利标题(中): 高通量扫描仪刀具
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申请号: US12528307申请日: 2008-02-22
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公开(公告)号: US20100320382A1公开(公告)日: 2010-12-23
- 发明人: Gilad Almogy , Avishai Bartov , Jürgen Frosien , Pavel Adamec , Helmut Banzhof
- 申请人: Gilad Almogy , Avishai Bartov , Jürgen Frosien , Pavel Adamec , Helmut Banzhof
- 申请人地址: IL Rehovot
- 专利权人: APPLIED MATERIALS ISRAEL, LTD.
- 当前专利权人: APPLIED MATERIALS ISRAEL, LTD.
- 当前专利权人地址: IL Rehovot
- 国际申请: PCT/EP2008/001413 WO 20080222
- 主分类号: G01N23/00
- IPC分类号: G01N23/00 ; H01J37/147
摘要:
A multi-beam scanning electron beam device (100) is described. The multi-bea scanning electron beam device having a column, includes a multi-beam emitter (110) for emitting a plurality of electron beams (12,13,14), at least one common electron beam optical element (130) having a common opening for at least two of the plurality of electron beams and being adapted for commonly influencing at least two of the plurality of electron beams, at least one individual electron beam optical element (140) for individually influencing the plurality of electron beams, a common objective lens assembly (150) for focusing the plurality of electrons beams having a common excitation for focusing at least two of the plurality of electron beams, and adapted for focusing the plurality of electron beams onto a specimen (20) for generation of a plurality of signal beams (121, 131,141), and a detection assembly (170) for individually detecting each signal beam on a corresponding detection element.
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