发明申请
- 专利标题: SEMICONDUCTOR STORAGE DEVICE
- 专利标题(中): 半导体存储设备
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申请号: US12814478申请日: 2010-06-13
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公开(公告)号: US20100322022A1公开(公告)日: 2010-12-23
- 发明人: Masao Shinozaki , Hajime Sato
- 申请人: Masao Shinozaki , Hajime Sato
- 专利权人: RENESAS ELECTRONICS CORPORATION
- 当前专利权人: RENESAS ELECTRONICS CORPORATION
- 优先权: JP2009-146809 20090619
- 主分类号: G11C8/18
- IPC分类号: G11C8/18 ; G11C7/00
摘要:
The present invention is directed to realize high-speed operation and low latency of a semiconductor storage device employing the QDR method. A memory cell array, a first buffer, a second buffer, a first circuit, a second circuit, a first DLL circuit, and a second DLL circuit are provided. The first DLL circuit generates a first internal clock signal so as to reduce a phase difference between a first clock signal fetched via the first buffer and the first internal clock signal transmitted to the first circuit. The second DLL circuit generates the second internal clock signal so as to reduce a phase difference between the second clock signal fetched via the second buffer and the second internal clock signal transmitted to the second circuit. With the configuration, input setup and hold time can be shortened, and the frequency of the clock signal can be further increased.
公开/授权文献
- US08351283B2 Semiconductor storage device 公开/授权日:2013-01-08
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