发明申请
US20100327228A1 GROUP III NITRIDE SEMICONDUCTOR EPITAXIAL SUBSTRATE AND METHOD FOR MANUFACTURING THE SAME 失效
III族氮化物半导体外延衬底及其制造方法

  • 专利标题: GROUP III NITRIDE SEMICONDUCTOR EPITAXIAL SUBSTRATE AND METHOD FOR MANUFACTURING THE SAME
  • 专利标题(中): III族氮化物半导体外延衬底及其制造方法
  • 申请号: US12866147
    申请日: 2009-01-28
  • 公开(公告)号: US20100327228A1
    公开(公告)日: 2010-12-30
  • 发明人: Akira BandoHiroshi Amano
  • 申请人: Akira BandoHiroshi Amano
  • 申请人地址: JP Minato-ku, Tokyo
  • 专利权人: Showa Denko K.K.
  • 当前专利权人: Showa Denko K.K.
  • 当前专利权人地址: JP Minato-ku, Tokyo
  • 优先权: JP2008-029456 20080808
  • 国际申请: PCT/JP2009/051347 WO 20090128
  • 主分类号: C09K11/64
  • IPC分类号: C09K11/64 H01L21/20
GROUP III NITRIDE SEMICONDUCTOR EPITAXIAL SUBSTRATE AND METHOD FOR MANUFACTURING THE SAME
摘要:
There is provided a group III nitride semiconductor epitaxial substrate which has a suppressed level of threading dislocation in the vertical direction and excellent crystal quality, the group III nitride semiconductor epitaxial substrate including a substrate (1) for growing an epitaxial film; and an ELO layer (4) having a composition of AlxGa1-xN (0≦x≦1) formed either on top of the substrate (1) or on top of a group III nitride layer (2) formed on top of the substrate (1), wherein the ELO layer (4) is a layer formed by using a mask pattern (3), which is composed of carbon and is formed either on top of the substrate (1) or on top of the group III nitride layer (2).
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