Invention Application
- Patent Title: ULTRA-SENSITIVE SUSCEPTIBILITY DETECTION APPARATUS OF ANHARMONIC RESONANCE MEASUREMENT TYPE USING ATOMIC MAGNETOMETER, AND METHOD OF USING SAME
- Patent Title (中): 使用原子磁力计的非均匀共振测量型超声敏感性检测装置及其使用方法
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Application No.: US12266726Application Date: 2008-11-07
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Publication No.: US20100327869A1Publication Date: 2010-12-30
- Inventor: Ki Woong Kim , Yong Ho Lee , Hyuk Chan Kwon , Jin Mok Kim , Yong Ki Park
- Applicant: Ki Woong Kim , Yong Ho Lee , Hyuk Chan Kwon , Jin Mok Kim , Yong Ki Park
- Applicant Address: KR Daejeon
- Assignee: Korea Research Institute of Standards and Science
- Current Assignee: Korea Research Institute of Standards and Science
- Current Assignee Address: KR Daejeon
- Priority: KR10-2008-0054638 20080611
- Main IPC: G01R33/44
- IPC: G01R33/44

Abstract:
The ultra-sensitive susceptibility detection apparatus of anharmonic resonance measurement type using an atomic magnetometer detects a change in susceptibility by a specimen containing an object to be measured. The apparatus includes an atomic magnetometer. The atomic magnetometer includes a cell containing an alkaline metallic atom, a light source for magnetically polarizing the alkaline metallic atom of the cell, and a bias magnetic field applicator for applying a bias magnetic field to adjust a measuring resonance frequency of the alkaline metallic atom. The apparatus includes an excitation magnetic field applicator for applying an excitation magnetic fields of different frequencies to magnetically excite the specimen, but not to couple the excitation field directly to the measuring atomic resonance frequency, and a measuring device for measuring a change in magnetic polarization of the alkaline metallic atom, which is affected by a magnetic field caused by the specimen being magnetically excited by the excitation magnetic field.
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