发明申请
- 专利标题： DETECTION OF TARGET COMPONENTS WITH THE HELP OF INDICATOR PARTICLES
- 专利标题（中）： 用指示剂颗粒的帮助检测目标组分
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申请号： US12863219申请日： 2009-01-19
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公开(公告)号： US20100330698A1公开(公告)日： 2010-12-30
- 发明人: Toon Hendrik Evers
- 申请人： Toon Hendrik Evers
- 申请人地址： NL EINDHOVEN
- 专利权人： KONINKLIJKE PHILIPS ELECTRONICS N.V.
- 当前专利权人： KONINKLIJKE PHILIPS ELECTRONICS N.V.
- 当前专利权人地址： NL EINDHOVEN
- 优先权： EP08100716.3 20080122
- 国际申请： PCT/IB09/50170 WO 20090119
- 主分类号： G01N33/50
- IPC分类号： G01N33/50 ; G01N33/48
摘要：
The invention relates to a system and a method for the detection of target components (102) in a sample with the help of indicator particles (101) distributed in said sample. The distance (d) between indicator particles (101) and a contact surface (112) is determined after the target components could bind to the contact surface and/or the indicator particles. Thus it is possible to detect how many target components (102) are bound without a need for a binding between indicator particles (101) and contact surface (112). Optionally the indicator particles (101) can be affected by a modulated force, e.g. via an electromagnet (141). The determination of the distance (d) between indicator particles (101) and contact surface (112) may for example be achieved by frustrated total internal reflection, measurement of magnetic fields, or FRET.
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