发明申请
US20100330773A1 SUBSTRATE PROCESSING METHOD AND SUBSTRATE PROCESSING APPARATUS 审中-公开
基板加工方法和基板加工装置

  • 专利标题: SUBSTRATE PROCESSING METHOD AND SUBSTRATE PROCESSING APPARATUS
  • 专利标题(中): 基板加工方法和基板加工装置
  • 申请号: US12822304
    申请日: 2010-06-24
  • 公开(公告)号: US20100330773A1
    公开(公告)日: 2010-12-30
  • 发明人: Shin HIYAMA
  • 申请人: Shin HIYAMA
  • 申请人地址: JP Tokyo
  • 专利权人: HITACHI-KOKUSAI ELECTRIC INC.
  • 当前专利权人: HITACHI-KOKUSAI ELECTRIC INC.
  • 当前专利权人地址: JP Tokyo
  • 优先权: JP2009-155146 20090630; JP2010-102004 20100427
  • 主分类号: H01L21/31
  • IPC分类号: H01L21/31 B05C11/10
SUBSTRATE PROCESSING METHOD AND SUBSTRATE PROCESSING APPARATUS
摘要:
Provided is a substrate processing method, which can fill an insulating film in a groove having a small width with a high aspect ratio and improve the productivity. The substrate processing method comprises loading a substrate into a processing chamber, supplying silicon compound gas including carbon and hydrogen into the processing chamber, irradiating ultraviolet light on the silicon compound gas supplied into the processing chamber to process the substrate, unloading the processed substrate from the processing chamber, and processing the inside of the processing chamber with excited oxygen-containing gas. Accordingly, an adhered matter generated when irradiating the ultraviolet light on the silicon compound gas to process the substrate and adhered to a structure such as an inner wall of the processing chamber can be processed with the excited oxygen-containing gas to modify it.
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