Invention Application
- Patent Title: SYSTEM AND METHOD FOR TESTING A CHARACTERISTIC IMPEDANCE OF A SIGNAL PATH ROUTING OF A PRINTED CIRCUIT BOARD
- Patent Title (中): 用于测试印刷电路板的信号路径路由特性阻抗的系统和方法
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Application No.: US12732201Application Date: 2010-03-26
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Publication No.: US20100332169A1Publication Date: 2010-12-30
- Inventor: HSIEN-CHUAN LIANG , SHEN-CHUN LI , SHOU-KUO HSU , YUNG-CHIEH CHEN
- Applicant: HSIEN-CHUAN LIANG , SHEN-CHUN LI , SHOU-KUO HSU , YUNG-CHIEH CHEN
- Applicant Address: TW Tu-Cheng
- Assignee: HON HAI PRECISION INDUSTRY CO., LTD.
- Current Assignee: HON HAI PRECISION INDUSTRY CO., LTD.
- Current Assignee Address: TW Tu-Cheng
- Priority: CN200910303765.1 20090626
- Main IPC: G01R27/16
- IPC: G01R27/16 ; G06F19/00
Abstract:
A method for testing a characteristic impedance of a signal path routing of a printed circuit board (PCB) controls the test device to test a characteristic impedance of the signal path routing of the PCB to get test data of the signal path routing of the PCB. The method further analyzes the test data of the signal path routing of the PCB get analysis results, generate a test report for storing the test data of each signal path routing of the PCB and the analysis results if all signal path routings of the PCB have been tested.
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