发明申请
- 专利标题： SYSTEM AND METHOD FOR TESTING A CHARACTERISTIC IMPEDANCE OF A SIGNAL PATH ROUTING OF A PRINTED CIRCUIT BOARD
- 专利标题（中）： 用于测试印刷电路板的信号路径路由特性阻抗的系统和方法
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申请号： US12732201申请日： 2010-03-26
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公开(公告)号： US20100332169A1公开(公告)日： 2010-12-30
- 发明人: HSIEN-CHUAN LIANG , SHEN-CHUN LI , SHOU-KUO HSU , YUNG-CHIEH CHEN
- 申请人： HSIEN-CHUAN LIANG , SHEN-CHUN LI , SHOU-KUO HSU , YUNG-CHIEH CHEN
- 申请人地址： TW Tu-Cheng
- 专利权人： HON HAI PRECISION INDUSTRY CO., LTD.
- 当前专利权人： HON HAI PRECISION INDUSTRY CO., LTD.
- 当前专利权人地址： TW Tu-Cheng
- 优先权： CN200910303765.1 20090626
- 主分类号： G01R27/16
- IPC分类号： G01R27/16 ; G06F19/00
摘要：
A method for testing a characteristic impedance of a signal path routing of a printed circuit board (PCB) controls the test device to test a characteristic impedance of the signal path routing of the PCB to get test data of the signal path routing of the PCB. The method further analyzes the test data of the signal path routing of the PCB get analysis results, generate a test report for storing the test data of each signal path routing of the PCB and the analysis results if all signal path routings of the PCB have been tested.
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