发明申请
- 专利标题： DEVICE AND METHOD TO SAMPLE AND ENRICH IMPURITIES IN HYDROGEN
- 专利标题（中）： 在氢气中测定和加强污染物的装置和方法
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申请号： US12835614申请日： 2010-07-13
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公开(公告)号： US20110005302A1公开(公告)日： 2011-01-13
- 发明人: Shabbir AHMED , Sheldon H.D. Lee , Romesh Kumar , Dionissios D. Papadias
- 申请人： Shabbir AHMED , Sheldon H.D. Lee , Romesh Kumar , Dionissios D. Papadias
- 申请人地址： US IL Chicago
- 专利权人： UCHICAGO ARGONNE LLC
- 当前专利权人： UCHICAGO ARGONNE LLC
- 当前专利权人地址： US IL Chicago
- 主分类号： G01N33/00
- IPC分类号： G01N33/00
摘要：
Provided herein are methods and devices to enrich trace quantities of impurities in gaseous mixtures, such as hydrogen fuel. The methods and devices rely on concentration of impurities so as to allow the detection of the impurities using commonly-available detection methods.
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