发明申请
US20110006278A1 VARIABLE RESISTANCE NON-VOLATILE MEMORY DEVICE AND METHOD FOR MANUFACTURING THE SAME 审中-公开
可变电阻非易失性存储器件及其制造方法

  • 专利标题: VARIABLE RESISTANCE NON-VOLATILE MEMORY DEVICE AND METHOD FOR MANUFACTURING THE SAME
  • 专利标题(中): 可变电阻非易失性存储器件及其制造方法
  • 申请号: US12864565
    申请日: 2009-01-26
  • 公开(公告)号: US20110006278A1
    公开(公告)日: 2011-01-13
  • 发明人: Kensuke Takahashi
  • 申请人: Kensuke Takahashi
  • 优先权: JP2008-016240 20080128
  • 国际申请: PCT/JP2009/051204 WO 20090126
  • 主分类号: H01L45/00
  • IPC分类号: H01L45/00 H01L21/16
VARIABLE RESISTANCE NON-VOLATILE MEMORY DEVICE AND METHOD FOR MANUFACTURING THE SAME
摘要:
A variable resistance non-volatile memory device of the laminated structure of an upper electrode a variable resistance material a lower electrode includes an insulating film formed for being contacted with the variable resistance material and a reset electrode formed for being contacted with the insulating film without being contacted with the upper electrode or the lower electrode. The device is reset by applying a voltage to the reset electrode. A low resistance value for the set state and a high resistance value for the reset state may be obtained as the current during the reset operation of the device is reduced. A low reset current and a high resistance ratio between the resistance value for the set state and that for the reset state are simultaneously achieved.
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