发明申请
- 专利标题: BONDING WIRE FOR SEMICONDUCTOR DEVICES
- 专利标题(中): 用于半导体器件的接合线
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申请号: US12669612申请日: 2008-12-03
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公开(公告)号: US20110011619A1公开(公告)日: 2011-01-20
- 发明人: Tomohiro Uno , Keiichi Kimura , Takashi Yamada
- 申请人: Tomohiro Uno , Keiichi Kimura , Takashi Yamada
- 申请人地址: JP Tokyo JP Iruma-shi, Saitama
- 专利权人: NIPPON STEEL MATERIALS CO., LTD.,NIPPON MICROMETAL CORPORATION
- 当前专利权人: NIPPON STEEL MATERIALS CO., LTD.,NIPPON MICROMETAL CORPORATION
- 当前专利权人地址: JP Tokyo JP Iruma-shi, Saitama
- 优先权: JP2007-312239 20071203
- 国际申请: PCT/JP2008/071969 WO 20081203
- 主分类号: H01B5/00
- IPC分类号: H01B5/00
摘要:
It is an object of the present invention to provide a highly-functional bonding wire which can reduce damages at a neck part, has good linearity of loops, stability of loop heights, and stability of bonded shape of a bonding wire, and can cope with semiconductor packaging techniques, such as low looping, thinning, achievement of a fine pitch, and three-dimensional packaging. A semiconductor-device bonding wire comprises a core member formed of an electrically-conductive metal, and a skin layer mainly composed of a face-centered cubic metal different from the core member and formed thereon. The percentage of orientations in crystalline orientations in the lengthwise direction in the surface of the skin layer is greater than or equal to 50%.
公开/授权文献
- US08389860B2 Bonding wire for semiconductor devices 公开/授权日:2013-03-05
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