- 专利标题: TRANSISTOR GATE ELECTRODE HAVING CONDUCTOR MATERIAL LAYER
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申请号: US12893983申请日: 2010-09-29
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公开(公告)号: US20110018031A1公开(公告)日: 2011-01-27
- 发明人: Anand Murthy , Boyan Boyanov , Suman Datta , Brian S. Doyle , Been-Yih Jin , Shaofeng Yu , Robert Chau
- 申请人: Anand Murthy , Boyan Boyanov , Suman Datta , Brian S. Doyle , Been-Yih Jin , Shaofeng Yu , Robert Chau
- 主分类号: H01L29/78
- IPC分类号: H01L29/78
摘要:
Various embodiments of the invention relate to a PMOS device having a transistor channel of silicon germanium material on a substrate, a gate dielectric having a dielectric constant greater than that of silicon dioxide on the channel, a gate electrode conductor material having a work function in a range between a valence energy band edge and a conductor energy band edge for silicon on the gate dielectric, and a gate electrode semiconductor material on the gate electrode conductor material.
公开/授权文献
- US07968957B2 Transistor gate electrode having conductor material layer 公开/授权日:2011-06-28
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